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Defect Recognition and Image Processing in Semiconductors 1997: Proceedings of the Seventh Conference on Defect Recognition and Image Processing, Berl (Hardcover)

Author: Doneker, J.

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Product Overview

This book provides a valuable overview of current techniques used to assess, monitor, and characterize defects from the atomic scale to inhomogeneities in complete silicon wafers. It addresses advances in defect analyzing techniques and instrumentation and their application to substrates, epilayers, and devices. The book discusses the merits and limits of characterization techniques; standardization; correlations between defects and device performance, including degradation and failure analysis; and the adaptation and application of standard characterization techniques to new materials. This volume also examines the impressive advances made possible by the increase in the number of nanoscale scanning techniques now available.

Specifications

Publisher Taylor & Francis Group
Mfg Part# 9780750305006
SKU 207538877
Format Hardcover
ISBN10 0750305002
Release Date 3/3/2008
Product Attributes
Book Format Hardcover
Number of Pages 0524
Publisher Taylor & Francis Group
Series Part 160
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$540.51 + $2.75 shipping
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