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Multi-Chip Module Test Strategies (Hardcover)

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Product Overview

MCMs today consist of complex and dense VLSI devices mounted into packages that allow little physical access to internal nodes. The complexity and cost associated with their test and diagnosis are major obstacles to their use. Multi-Chip Module Test Strategies presents state-of-the-art test strategies for MCMs. This volume of original research is designed for engineers interested in practical implementations of MCM test solutions and for designers looking for leading edge test and design-for-testability solutions for their next designs.Multi-Chip Module Test Strategies consists of eight contributions by leading researchers. It is designed to provide a comprehensive and well-balanced coverage of the MCM test domain.Multi-Chip Module Test Strategies has also been published as a special issue of the Journal of Electronic Testing: Theory and Applications (JETTA, Volume 10, Numbers 1 and 2).

Specifications

Publisher Kluwer Academic Publishers
Mfg Part# 9780792399209
SKU 202636921
Format Hardcover
ISBN10 079239920X
Release Date 8/13/2012
Product Attributes
Book Format Hardcover
Number of Pages 0166
Publisher Kluwer Academic Publishers
Series Part 7
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