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The 10th International Conference on X-Ray Microscopy Chicago, Illinois, USA, 15-20 August 2010 (Paperback)

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The 10th International Conference on X-Ray Microscopy McNulty, Ian (EDT)/ Eyberger, Catherine (EDT)/ Lai, Barry (EDT) 1 of 1
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Learn more about The 10th International Conference on X-Ray Microscopy:

Format: Paperback
ISBN-10: 0735409250
ISBN-13: 9780735409255
Sku: 225107368
Publish Date: 10/1/2011
Dimensions:  (in Inches) 11H x 8.25L x 1T
Pages:  473
See more in Physics / Magnetism
 
*Author: McNulty, Ian (EDT)/ Eyberger, Catherine (EDT)/ Lai, Barry (EDT) *Series Title: AIP Conference Proceedings *Subtitle: Chicago, Illinois, USA, 15-20 August 2010 *Publication Date: 2011/10/31 *Number of Pages: 473 *Binding Type: Paperback *Language: English *Depth: 1.00 *Width: 8.25 *Height: 11.00
From the Publisher:
This conference proceedings would be of interest to researchers and students in universities, national laboratories, synchrotron and x-ray laser facilities, and industries in the technical fields. Fields of interest include high-resolution x-ray microscopy and imaging, magnetism and magnetic materials, biological and biomedical sciences, and materials and condensed matter sciences. The 10th International Conference on X-ray Microscopy (XRM 2010) was held on August 15-20, 2010 in Chicago, Illinois, USA. The latest advances in x-ray microscopy instrumentation and methods and their applications to biology, environmental, magnetism, and materials science were presented at XRM 2010.

Product Attributes

Product attributeBook Format:   Paperback
Product attributeNumber of Pages:   0473
Product attributePublisher:   American Institute of Physics
Product attributeSeries Part:   1365
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