The 10th International Conference on X-Ray Microscopy : Chicago, Illinois, USA, 15-20 August 2010 (Paperback)

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Product Overview

*Author: McNulty, Ian (EDT)/ Eyberger, Catherine (EDT)/ Lai, Barry (EDT) *Series Title: AIP Conference Proceedings *Subtitle: Chicago, Illinois, USA, 15-20 August 2010 *Publication Date: 2011/10/31 *Number of Pages: 473 *Binding Type: Paperback *Language: English *Depth: 1.00 *Width: 8.25 *Height: 11.00


Publisher Amer Inst of Physics
Mfg Part# 9780735409255
SKU 225107368
Format Paperback
ISBN10 0735409250
Release Date 10/1/2011
Dimensions (in Inches) 11H x 8.25L x 1T
From the Publisher
Editors Note This conference proceedings would be of interest to researchers and students in universities, national laboratories, synchrotron and x-ray laser facilities, and industries in the technical fields. Fields of interest include high-resolution x-ray microscopy and imaging, magnetism and magnetic materials, biological and biomedical sciences, and materials and condensed matter sciences. The 10th International Conference on X-ray Microscopy (XRM 2010) was held on August 15-20, 2010 in Chicago, Illinois, USA. The latest advances in x-ray microscopy instrumentation and methods and their applications to biology, environmental, magnetism, and materials science were presented at XRM 2010.
Product Attributes
Book Format Paperback
Number of Pages 0473
Publisher American Institute of Physics
Series Part 1365
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