The 10th International Conference on X-Ray Microscopy Chicago, Illinois, USA, 15-20 August 2010 (Paperback)
|*Author: McNulty, Ian (EDT)/ Eyberger, Catherine (EDT)/ Lai, Barry (EDT) *Series Title: AIP Conference Proceedings *Subtitle: Chicago, Illinois, USA, 15-20 August 2010 *Publication Date: 2011/10/31 *Number of Pages: 473 *Binding Type: Paperback *Language: English *Depth: 1.00 *Width: 8.25 *Height: 11.00|
From the Publisher:
This conference proceedings would be of interest to researchers and students in universities, national laboratories, synchrotron and x-ray laser facilities, and industries in the technical fields. Fields of interest include high-resolution x-ray microscopy and imaging, magnetism and magnetic materials, biological and biomedical sciences, and materials and condensed matter sciences. The 10th International Conference on X-ray Microscopy (XRM 2010) was held on August 15-20, 2010 in Chicago, Illinois, USA. The latest advances in x-ray microscopy instrumentation and methods and their applications to biology, environmental, magnetism, and materials science were presented at XRM 2010.