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i1Profiler Software Specifications |
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Macintosh® |
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MacOS X 10.5.8, 10.6.x and 10.7.x (with the latest updates installed) |
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1GB RAM |
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Intel® Processor |
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Up to 2GB of available disk space (depending on components installed) |
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Powered USB Port |
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Monitor resolution of 1024x768 pixels or higher |
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Dual display support requires either 2 video cards or a dual head video card that supports dual video LUTs being loaded |
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DVD drive or high-speed internet connection required for software install, download and automatic software update |
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Windows® |
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Microsoft® Windows® XP® 32 bit (with latest Service Packs and updates installed) Microsoft® Windows Vista® 32 or 64 bit (with latest Service Packs and updates installed) |
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Microsoft® Windows 7® 32 or 64 bit (with latest Service Packs and updates installed) |
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1GB RAM |
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Intel® Pentium® IV or AMD® Athlon® XP or better CPU |
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Up to 2GB of available disk space (depending on components installed) |
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Powered USB Port |
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Monitor resolution of 1024x768 pixels or higher |
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Dual display support requires either 2 video cards or a dual head video card that supports dual video LUTs being loaded |
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Network adaptor installed and driver loaded |
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DVD drive or high-speed internet connection required for software install, download and automatic software update |
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LANGUAGE VERSIONS |
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This product is available in the following languages: |
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Chinese (Simplified) |
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English |
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French |
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German |
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Italian |
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Japanese |
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Portuguese |
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Spanish |
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Russian |
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i1Pro Hardware Specifications |
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SPECTRAL ENGINE |
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i1® technology with built-in wavelengths check |
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Spectral analyzer: Holographic diffraction grating with 128-pixel diode array |
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Spectral Range: 380 - 730 nm |
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Physical sampling interval: 3.5 nm |
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Optical resolution: 10 nm |
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Spectral reporting: 380 ... 730 nm in 10 nm steps |
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Measurement Frequency in scanning mode: 200 measurements per second |
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OPTICS |
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Measurement geometry: 45°/0° ring illumination optics, ISO 13655:2009 |
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Measurement aperture: 4.5 mm (0.18”) diameter (effective measurement aperture during scanning is depending on the patch size and measurement speed) |
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Illumination Spot Size: 3.5 mm (0.14”) |
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Light source: Gas filled tungsten (illuminant type A) and UV LED |
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REFLECTANCE MEASUREMENT |
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Data Format: Spectral Reflectance [dimensionless] |
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Measurement Conditions: |
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UV included - ISO 13655:2009 measurement condition M0 |
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D50 - ISO 13655:2009 measurement condition M1 |
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UV excluded Filter - ISO 13655:2009 measurement condition M2 |
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OBC: Optical Brightener Compensation (OBC) with i1Profiler software |
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Calibration: Manual on external ceramic white reference |
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Measurement Background: white, ISO 13655:2009; for measurements on backup board |
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Minimal Media Thickness: 3 mm (0.12”) on backup board |
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Minimal Patch Size in Scanning Mode: 7 x 10 mm (0.28” x 0.39”) (Width x Height) with sensor ruler 10 x 10 mm (0.39” x 0.39”) (Width x Height) without sensor ruler |
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Inter-instrument agreement: 0.4 ?E94* average, 1.0 ?E94* max. (deviation from X-Rite manufacturing standard at a temperature of 23ºC (73.4ºF) on 12 BCRA tiles (D50, 2º)) |
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Short-term repeatability: 0.1 ?E94* on white (D50,2°, mean of 10 measurements every 3 seconds on white) |
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EMISSIVE MEASUREMENT |
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Data format: Spectral radiance (mW/nm/m2 /sr); Luminance Y (cd/m2) |
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Measurement range: 0.2 - 1200 cd/m2 on a typical LCD-Monitor |
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Short-term repeatability: x,y: +/- 0.002 typical (5000°K, 80 cd/m2) |
