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Scanning Microscopy for Nanotechnology : Techniques And Applications (Hardcover)

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Product Overview

This book presents scanning electron microscopy (SEM) fundamentals and applications for nanotechnology. It includes integrated fabrication techniques using the SEM, such as e-beam and FIB, and it covers in-situ nanomanipulation of materials. The book is written by international experts from the top nano-research groups that specialize in nanomaterials characterization. The book will appeal to nanomaterials researchers, and to SEM development specialists.

Specifications

Publisher Springer
Mfg Part# 9780387333250
SKU 202933233
Format Hardcover
ISBN10 0387333258
Release Date 8/13/2012
Product Attributes
Book Format Hardcover
Number of Pages 0522
Publisher Springer
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